Randomized sample size F tests for the one-way layout

Utilize este identificador para referenciar este registo: http://hdl.handle.net/10362/75585

Título:	Randomized sample size F tests for the one-way layout
Autor:	Mexia, João T. Moreira, Elsa E.
Palavras-chave:	F tests optimum properties Random sample sizes simultaneous confidence intervals Physics and Astronomy(all)
Data:	1-Dez-2010
Editora:	AIP - American Institute of Physics
Citação:	Mexia, J. T., & Moreira, E. E. (2010). Randomized sample size F tests for the one-way layout. In G. Psihoyios, & C. Tsitouras (Eds.), NUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III (Vol. I-III, pp. 1248-1251). (AIP Conference Proceedings; Vol. 1281). AIP - American Institute of Physics. https://doi.org/10.1063/1.3497917
Resumo:	Distributions and densities for F test statistics are obtained assuming random sample sizes, thus getting random degrees of freedom and non-centrality parameters. Classical optimum properties are extended to this new setup as well as Scheffé Theorem for simultaneous confidence intervals.
Peer review:	yes
URI:	http://www.scopus.com/inward/record.url?scp=79954531773&partnerID=8YFLogxK
DOI:	https://doi.org/10.1063/1.3497917
ISBN:	978-0-7354-0834-0
ISSN:	0094-243X
Aparece nas colecções:	FCT: CMA - Documentos de conferências internacionais

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