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Randomized sample size F tests for the one-way layout

2010-12-01Documento de conferência Acesso aberto
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dc.contributor.authorMexia, João T.
dc.contributor.authorMoreira, Elsa E.
dc.contributor.institutionCMA - Centro de Matemática e Aplicações
dc.date.accessioned2019-07-15T22:55:32Z
dc.date.available2019-07-15T22:55:32Z
dc.date.issued2010-12-01
dc.description.abstractDistributions and densities for F test statistics are obtained assuming random sample sizes, thus getting random degrees of freedom and non-centrality parameters. Classical optimum properties are extended to this new setup as well as Scheffé Theorem for simultaneous confidence intervals.en
dc.description.versionpublishersversion
dc.description.versionpublished
dc.format.extent4
dc.format.extent618045
dc.identifier.doi10.1063/1.3497917
dc.identifier.isbn978-0-7354-0834-0
dc.identifier.issn0094-243X
dc.identifier.otherPURE: 11709539
dc.identifier.otherPURE UUID: d8e08375-151c-41ae-b011-55b621ce0559
dc.identifier.otherScopus: 79954531773
dc.identifier.otherWOS: 000289661500334
dc.identifier.otherORCID: /0000-0003-0116-1917/work/64040765
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=79954531773&partnerID=8YFLogxK
dc.identifier.urlhttps://www.scopus.com/pages/publications/79954531773
dc.language.isoeng
dc.peerreviewedyes
dc.publisherAIP - American Institute of Physics
dc.subjectF tests
dc.subjectoptimum properties
dc.subjectRandom sample sizes
dc.subjectsimultaneous confidence intervals
dc.subjectGeneral Physics and Astronomy
dc.titleRandomized sample size F tests for the one-way layouten
dc.typeconference object
degois.publication.firstPage1248
degois.publication.lastPage1251
degois.publication.titleNUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III
degois.publication.titleInternational Conference on Numerical Analysis and Applied Mathematics 2010, ICNAAM-2010
degois.publication.volumeI-III
dspace.entity.typePublication
rcaap.rightsopenAccess

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