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Static and dynamic modelling for IGZO-TFT devices with high-k multilayer dielectric
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Resumo(s)
Indium-Gallium-Zinc-Oxide thin-film transistors (IGZO-TFT) are a strong alternative
technology for the current trend of Si based field-effect transistor (FET) for flat-panel
display backplane and internet of things internet of things (IoT). In these applications,
comprehensive understanding and accurate modelling of thin-film transistor (TFT) is
compulsory for systematic circuit design.
In this study, IGZO-TFTs with high- multilayer dielectric, which were previously
fabricated at CENIMAT/I3N Portugal are characterized in the University of Cambridge at
the department of electrical engineering. Alongside this characterization, it is developed a
compact static model that is capable of describing above-threshold linear behaviour. This
model is based on physical parameters and also accounts the effects of contact resistance
in source and drain terminals. Furthermore, it is developed a dynamic small signals
model, based on conventional FET models and its validity is studied with the help of
S-Parameters and capacitance-voltage characteristics (C-V) characteristics.
The great advantage of the developed models, in both static and dynamic aspects,
is the low number of parameters required to be extracted physically with good fitting
results. This can empower new users that are not so familiar with the modelling aspect
to design simple electrical circuits with IGZO-TFTs.
Descrição
Palavras-chave
IGZO TFT Static models Dynamic models Compact models small signal