Utilize este identificador para referenciar este registo: http://hdl.handle.net/10362/162649
Título: A Proposed Model for Detecting Defects in Software Projects
Autor: Mahmoud, Alia Nabil
Abdelaziz, Ahmed
Santos, Vítor
Freire, Mário M.
Palavras-chave: Defects
Linear regression
Logistic regression
Software projects
Statistical model
Signal Processing
Information Systems
Hardware and Architecture
Computer Networks and Communications
Control and Optimization
Electrical and Electronic Engineering
SDG 9 - Industry, Innovation, and Infrastructure
Data: Jan-2024
Resumo: Defective modules that cause software execution failures are common in large software projects. Source code for a significant number of modules may be found in several software repositories. This software repository includes each module’s software metrics and the module’s faulty status. Software companies face a considerable problem detecting defects in sizeable and complex programming code. In addition, many international reports, such as the comprehensive human appraisal for originating (CHAOS) report, have mentioned that there are countless reasons for the failure of software projects, including the inability to detect errors and defects in the programming code of those projects at an early stage. This research employs a statistical analysis technique to reveal the characteristics that indicate the faulty status of software modules. It is recommended that statistical analysis models derived from the retrieved information be merged with existing project metrics and bug data to improve prediction. When all algorithms are merged with weighted votes, the results indicate enhanced prediction abilities. The proposed statistical analysis outperforms the state-of-the-art method (association rule, decision tree, Naive Bayes, and neural network) in terms of accuracy by 9.1%, 10.3%, 13.1%, and 13.1%, respectively.
Descrição: Mahmoud, A. N., Abdelaziz, A., Santos, V., & Freire, M. M. (2024). A Proposed Model for Detecting Defects in Software Projects. Indonesian Journal of Electrical Engineering and Computer Science, 33(1), 290-302. https://doi.org/10.11591/ijeecs.v33.i1.pp290-302
Peer review: yes
URI: http://hdl.handle.net/10362/162649
DOI: https://doi.org/10.11591/ijeecs.v33.i1.pp290-302
ISSN: 2502-4752
Aparece nas colecções:NIMS: MagIC - Artigos em revista internacional com arbitragem científica (Peer-Review articles in international journals)

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