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Autores
Orientador(es)
Resumo(s)
The paper presents an optimization-based methodology for the determination of thin-film transistors series contact resistancefigmethodology in Python is presented. The validity of results obtained against experimental devices characteristics is demonstrated. The advantage and limitations of the proposed methodology are also discussed.
Descrição
Publisher Copyright:
© 2022 Lodz University of Technology.
Palavras-chave
compact model contact resistances TFTs Hardware and Architecture Signal Processing Energy Engineering and Power Technology Biomedical Engineering Electrical and Electronic Engineering Modelling and Simulation Instrumentation
Contexto Educativo
Citação
Editora
Institute of Electrical and Electronics Engineers (IEEE)
