Publicação
Built-in self test of high speed analog-to-digital converters
| dc.contributor.author | Santin, Edinei | |
| dc.contributor.author | Oliveira, Luis B. | |
| dc.contributor.author | Goes, João | |
| dc.contributor.institution | DEE2010-A2 Electrónica | |
| dc.contributor.institution | CTS - Centro de Tecnologia e Sistemas | |
| dc.contributor.institution | DEE - Departamento de Engenharia Electrotécnica e de Computadores | |
| dc.contributor.institution | UNINOVA-Instituto de Desenvolvimento de Novas Tecnologias | |
| dc.contributor.pbl | Institute of Electrical and Electronics Engineers (IEEE) | |
| dc.date.accessioned | 2020-02-21T23:52:07Z | |
| dc.date.available | 2020-02-21T23:52:07Z | |
| dc.date.issued | 2019-12-01 | |
| dc.description.abstract | Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses. | en |
| dc.description.version | published | |
| dc.format.extent | 7 | |
| dc.format.extent | 3153375 | |
| dc.identifier.doi | 10.1109/MIM.2019.8917897 | |
| dc.identifier.issn | 1094-6969 | |
| dc.identifier.other | PURE: 15905940 | |
| dc.identifier.other | PURE UUID: d56248b5-0e03-4c9f-b877-7dfe85fc0b91 | |
| dc.identifier.other | Scopus: 85075971603 | |
| dc.identifier.other | WOS: 000501232500003 | |
| dc.identifier.uri | http://hdl.handle.net/10362/93180 | |
| dc.identifier.url | https://www.scopus.com/pages/publications/85075971603 | |
| dc.language.iso | eng | |
| dc.peerreviewed | yes | |
| dc.subject | Instrumentation | |
| dc.subject | Electrical and Electronic Engineering | |
| dc.title | Built-in self test of high speed analog-to-digital converters | en |
| dc.type | journal article | |
| degois.publication.firstPage | 4 | |
| degois.publication.issue | 6 | |
| degois.publication.lastPage | 10 | |
| degois.publication.title | IEEE Instrumentation and Measurement Magazine | |
| degois.publication.volume | 22 | |
| dspace.entity.type | Publication | |
| rcaap.rights | restrictedAccess |
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