Publication . Naia, M. Duarte; Gordo, P. M.; Teodoro, O. M. N. D.; Lima, A. P. de; Moutinho, A. M. C.; CeFITec – Centro de Física e Investigação Tecnológica; DF – Departamento de Física
In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.
