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http://hdl.handle.net/10362/75585| Title: | Randomized sample size F tests for the one-way layout |
| Author: | Mexia, João T. Moreira, Elsa E. |
| Keywords: | F tests optimum properties Random sample sizes simultaneous confidence intervals Physics and Astronomy(all) |
| Issue Date: | 1-Dec-2010 |
| Publisher: | AIP - American Institute of Physics |
| Citation: | Mexia, J. T., & Moreira, E. E. (2010). Randomized sample size F tests for the one-way layout. In G. Psihoyios, & C. Tsitouras (Eds.), NUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III (Vol. I-III, pp. 1248-1251). (AIP Conference Proceedings; Vol. 1281). AIP - American Institute of Physics. https://doi.org/10.1063/1.3497917 |
| Abstract: | Distributions and densities for F test statistics are obtained assuming random sample sizes, thus getting random degrees of freedom and non-centrality parameters. Classical optimum properties are extended to this new setup as well as Scheffé Theorem for simultaneous confidence intervals. |
| Peer review: | yes |
| URI: | http://www.scopus.com/inward/record.url?scp=79954531773&partnerID=8YFLogxK |
| DOI: | https://doi.org/10.1063/1.3497917 |
| ISBN: | 978-0-7354-0834-0 |
| ISSN: | 0094-243X |
| Appears in Collections: | FCT: CMA - Documentos de conferências internacionais |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 1.3497917.pdf | 603,56 kB | Adobe PDF | View/Open |
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