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Utilize este identificador para referenciar este registo: http://hdl.handle.net/10362/36020
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Campo DCValorIdioma
dc.contributor.authorOhtomi, S.-
dc.contributor.authorMatsui, M.-
dc.contributor.authorMochizuki, Y.-
dc.contributor.authorSuga, A.-
dc.contributor.authorKato, H.-
dc.contributor.authorHoshino, M.-
dc.contributor.authorDuflot, D.-
dc.contributor.authorLimão-Vieira, P.-
dc.contributor.authorTanaka, Hideaki-
dc.date.accessioned2018-05-04T22:21:13Z-
dc.date.available2018-05-04T22:21:13Z-
dc.date.issued2015-09-07-
dc.identifier.citationOhtomi, S., Matsui, M., Mochizuki, Y., Suga, A., Kato, H., Hoshino, M., Duflot, D., Limão-Vieira, P., & Tanaka, H. (2015). Electronic excitation to low-lying states of GeF4 molecule by electron impact: A comparative study with CF4 and SiF4 molecules. In C. Diaz, I. Rabadan, G. Garcia, L. Mendez, & F. Martin (Eds.), XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015) (Vol. Part 1-12). Article 072041 (Journal Of Physics: Conference Series; Vol. 635, No. 7). IOP Publishing. https://doi.org/10.1088/1742-6596/635/7/072041-
dc.identifier.issn1742-6588-
dc.identifier.otherPURE: 4095058-
dc.identifier.otherPURE UUID: 543aa883-87e4-4256-8ce8-edde0aba7b43-
dc.identifier.otherScopus: 84948844657-
dc.identifier.otherWOS: 000366407000389-
dc.identifier.otherORCID: /0000-0003-2696-1152/work/151412023-
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=84948844657&partnerID=8YFLogxK-
dc.description.abstractWe report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.en
dc.language.isoeng-
dc.publisherIOP Publishing-
dc.rightsopenAccess-
dc.subjectSCATTERING-
dc.subjectSPECTROSCOPY-
dc.subjectPhysics and Astronomy(all)-
dc.titleElectronic excitation to low-lying states of GeF4 molecule by electron impact-
dc.typeconferenceObject-
degois.publication.titleXXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)-
degois.publication.title29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)-
degois.publication.volumePart 1-12-
dc.peerreviewedyes-
dc.identifier.doihttps://doi.org/10.1088/1742-6596/635/7/072041-
dc.description.versionpublishersversion-
dc.description.versionpublished-
dc.title.subtitleA comparative study with CF4 and SiF4 molecules-
dc.contributor.institutionCeFITec – Centro de Física e Investigação Tecnológica-
dc.contributor.institutionDF – Departamento de Física-
Aparece nas colecções:FCT: DF - Documentos de conferências internacionais

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