Browsing by Author Marcuello, Carlos
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| Issue Date | Title | Author(s) | Type | Access Type |
|---|---|---|---|---|
| Oct-2025 | Nanoscale Analysis beyond Imaging by Atomic Force Microscopy | Marcuello, Carlos; Lim, Kee Siang; Nisini, Giacomo; Pokrovsky, Vadim S.; Conde, João; Ruggeri, Francesco Simone | review | ![]() |


