Fino, Maria Helena2023-06-142023-06-142022978-1-6654-6176-4978-83-63578-22-0978-83-63578-21-3PURE: 55142724PURE UUID: 6ba5f599-7297-44f3-9975-474b747e8850Scopus: 85136163197ORCID: /0000-0003-3884-0059/work/152661880http://hdl.handle.net/10362/153905Publisher Copyright: © 2022 Lodz University of Technology.The paper presents an optimization-based methodology for the determination of thin-film transistors series contact resistancefigmethodology in Python is presented. The validity of results obtained against experimental devices characteristics is demonstrated. The advantage and limitations of the proposed methodology are also discussed.4518133engcompact modelcontact resistancesTFTsHardware and ArchitectureSignal ProcessingEnergy Engineering and Power TechnologyBiomedical EngineeringElectrical and Electronic EngineeringModelling and SimulationInstrumentationconference object10.23919/MIXDES55591.2022.9837978https://www.scopus.com/pages/publications/85136163197